Demonstrating a superconducting dual-rail cavity qubit with erasure-detected logical measurements

  1. Kevin S. Chou,
  2. Tali Shemma,
  3. Heather McCarrick,
  4. Tzu-Chiao Chien,
  5. James D. Teoh,
  6. Patrick Winkel,
  7. Amos Anderson,
  8. Jonathan Chen,
  9. Jacob Curtis,
  10. Stijn J. de Graaf,
  11. John W.O. Garmon,
  12. Benjamin Gudlewski,
  13. William D. Kalfus,
  14. Trevor Keen,
  15. Nishaad Khedkar,
  16. Chan U Lei,
  17. Gangqiang Liu,
  18. Pinlei Lu,
  19. Yao Lu,
  20. Aniket Maiti,
  21. Luke Mastalli-Kelly,
  22. Nitish Mehta,
  23. Shantanu O. Mundhada,
  24. Anirudh Narla,
  25. Taewan Noh,
  26. Takahiro Tsunoda,
  27. Sophia H. Xue,
  28. Joseph O. Yuan,
  29. Luigi Frunzio,
  30. Jose Aumentado,
  31. Shruti Puri,
  32. Steven M. Girvin,
  33. S. Harvey Moseley Jr.,
  34. and Robert J. Schoelkopf
A critical challenge in developing scalable error-corrected quantum systems is the accumulation of errors while performing operations and measurements. One promising approach is to
design a system where errors can be detected and converted into erasures. A recent proposal aims to do this using a dual-rail encoding with superconducting cavities. In this work, we implement such a dual-rail cavity qubit and use it to demonstrate a projective logical measurement with erasure detection. We measure logical state preparation and measurement errors at the 0.01%-level and detect over 99% of cavity decay events as erasures. We use the precision of this new measurement protocol to distinguish different types of errors in this system, finding that while decay errors occur with probability ∼0.2% per microsecond, phase errors occur 6 times less frequently and bit flips occur at least 170 times less frequently. These findings represent the first confirmation of the expected error hierarchy necessary to concatenate dual-rail erasure qubits into a highly efficient erasure code.

Disentangling Losses in Tantalum Superconducting Circuits

  1. Kevin D. Crowley,
  2. Russell A. McLellan,
  3. Aveek Dutta,
  4. Nana Shumiya,
  5. Alexander P.M. Place,
  6. Xuan Hoang Le,
  7. Youqi Gang,
  8. Trisha Madhavan,
  9. Nishaad Khedkar,
  10. Yiming Cady Feng,
  11. Esha A. Umbarkar,
  12. Xin Gui,
  13. Lila V. H. Rodgers,
  14. Yichen Jia,
  15. Mayer M. Feldman,
  16. Stephen A. Lyon,
  17. Mingzhao Liu,
  18. Robert J. Cava,
  19. Andrew A. Houck,
  20. and Nathalie P. de Leon
Superconducting qubits are a leading system for realizing large scale quantum processors, but overall gate fidelities suffer from coherence times limited by microwave dielectric loss.
Recently discovered tantalum-based qubits exhibit record lifetimes exceeding 0.3 ms. Here we perform systematic, detailed measurements of superconducting tantalum resonators in order to disentangle sources of loss that limit state-of-the-art tantalum devices. By studying the dependence of loss on temperature, microwave photon number, and device geometry, we quantify materials-related losses and observe that the losses are dominated by several types of saturable two level systems (TLSs), with evidence that both surface and bulk related TLSs contribute to loss. Moreover, we show that surface TLSs can be altered with chemical processing. With four different surface conditions, we quantitatively extract the linear absorption associated with different surface TLS sources. Finally, we quantify the impact of the chemical processing at single photon powers, the relevant conditions for qubit device performance. In this regime we measure resonators with internal quality factors ranging from 5 to 15 x 10^6, comparable to the best qubits reported. In these devices the surface and bulk TLS contributions to loss are comparable, showing that systematic improvements in materials on both fronts will be necessary to improve qubit coherence further.