Correlated quasiparticle poisoning from phonon-only events in superconducting qubits

  1. E. Yelton,
  2. C. P. Larson,
  3. K. Dodge,
  4. K. Okubo,
  5. and B. L. T. Plourde
Throughout multiple cooldowns we observe a power-law reduction in time for the rate of multi-qubit correlated poisoning events, while the rate of shifts in qubit offset-charge remains
constant; evidence of a non-ionizing source of pair-breaking phonon bursts for superconducting qubits. We investigate different types of sample packaging, some of which are sensitive to mechanical impacts from the cryocooler pulse tube. One possible source of these events comes from relaxation of thermally-induced stresses from differential thermal contraction between the device layer and substrate.

Quasiparticle poisoning of superconducting qubits with active gamma irradiation

  1. C. P. Larson,
  2. E. Yelton,
  3. K. Dodge,
  4. K. Okubo,
  5. J. Batarekh,
  6. V. Iaia,
  7. N. A. Kurinsky,
  8. and B. L. T. Plourde
When a high-energy particle, such as a γ-ray or muon, impacts the substrate of a superconducting qubit chip, large numbers of electron-hole pairs and phonons are created. The ensuing
dynamics of the electrons and holes changes the local offset-charge environment for qubits near the impact site. The phonons that are produced have energy above the superconducting gap in the films that compose the qubits, leading to quasiparticle excitations above the superconducting ground state when the phonons impinge on the qubit electrodes. An elevated density of quasiparticles degrades qubit coherence, leading to errors in qubit arrays. Because these pair-breaking phonons spread throughout much of the chip, the errors can be correlated across a large portion of the array, posing a significant challenge for quantum error correction. In order to study the dynamics of γ-ray impacts on superconducting qubit arrays, we use a γ-ray source outside the dilution refrigerator to controllably irradiate our devices. By using charge-sensitive transmon qubits, we can measure both the offset-charge shifts and quasiparticle poisoning due to the γ irradiation at different doses. We study correlations between offset-charge shifts and quasiparticle poisoning for different qubits in the array and compare this with numerical modeling of charge and phonon dynamics following a γ-ray impact. We thus characterize the poisoning footprint of these impacts and quantify the performance of structures for mitigating phonon-mediated quasiparticle poisoning.

High-Fidelity Measurement of a Superconducting Qubit using an On-Chip Microwave Photon Counter

  1. A. Opremcak,
  2. C. H. Liu,
  3. C. Wilen,
  4. K. Okubo,
  5. B. G. Christensen,
  6. D. Sank,
  7. T. C. White,
  8. A. Vainsencher,
  9. M. Giustina,
  10. A. Megrant,
  11. B. Burkett,
  12. B. L. T. Plourde,
  13. and R. McDermott
We describe an approach to the high-fidelity measurement of a superconducting qubit using an on-chip microwave photon counter. The protocol relies on the transient response of a dispersively
coupled measurement resonator to map the state of the qubit to „bright“ and „dark“ cavity pointer states that are characterized by a large differential photon occupation. Following this mapping, we photodetect the resonator using the Josephson Photomultipler (JPM), which transitions between classically distinguishable flux states when cavity photon occupation exceeds a certain threshold. Our technique provides access to the binary outcome of projective quantum measurement at the millikelvin stage without the need for quantum-limited preamplification and thresholding at room temperature. We achieve raw single-shot measurement fidelity in excess of 98% across multiple samples using this approach in total measurement times under 500 ns. In addition, we show that the backaction and crosstalk associated with our measurement protocol can be mitigated by exploiting the intrinsic damping of the JPM itself.