Throughout multiple cooldowns we observe a power-law reduction in time for the rate of multi-qubit correlated poisoning events, while the rate of shifts in qubit offset-charge remainsconstant; evidence of a non-ionizing source of pair-breaking phonon bursts for superconducting qubits. We investigate different types of sample packaging, some of which are sensitive to mechanical impacts from the cryocooler pulse tube. One possible source of these events comes from relaxation of thermally-induced stresses from differential thermal contraction between the device layer and substrate.
When a high-energy particle, such as a γ-ray or muon, impacts the substrate of a superconducting qubit chip, large numbers of electron-hole pairs and phonons are created. The ensuingdynamics of the electrons and holes changes the local offset-charge environment for qubits near the impact site. The phonons that are produced have energy above the superconducting gap in the films that compose the qubits, leading to quasiparticle excitations above the superconducting ground state when the phonons impinge on the qubit electrodes. An elevated density of quasiparticles degrades qubit coherence, leading to errors in qubit arrays. Because these pair-breaking phonons spread throughout much of the chip, the errors can be correlated across a large portion of the array, posing a significant challenge for quantum error correction. In order to study the dynamics of γ-ray impacts on superconducting qubit arrays, we use a γ-ray source outside the dilution refrigerator to controllably irradiate our devices. By using charge-sensitive transmon qubits, we can measure both the offset-charge shifts and quasiparticle poisoning due to the γ irradiation at different doses. We study correlations between offset-charge shifts and quasiparticle poisoning for different qubits in the array and compare this with numerical modeling of charge and phonon dynamics following a γ-ray impact. We thus characterize the poisoning footprint of these impacts and quantify the performance of structures for mitigating phonon-mediated quasiparticle poisoning.
Quantum error correction can preserve quantum information in the presence of local errors; however, errors that are correlated across a qubit array are fatal. For superconducting qubits,high-energy particle impacts due to background radioactivity or cosmic ray muons produce bursts of energetic phonons that travel throughout the substrate and create excitations out of the superconducting ground state, known as quasiparticles, which poison all qubits on the chip. Here we use thick normal metal reservoirs on the back side of the chip to promote rapid downconversion of phonons to sufficiently low energies where they can no longer poison qubits. We introduce a pump-probe scheme involving controlled injection of pair-breaking phonons into the qubit chips. We examine quasiparticle poisoning on chips with and without backside metallization and demonstrate a reduction in the flux of pair-breaking phonons by more than a factor of 20. In addition, we use a Ramsey interferometer scheme to simultaneously monitor quasiparticle parity on three qubits for each chip and observe a two-order of magnitude reduction in correlated poisoning due to ambient radiation. Our approach reduces correlated errors due to background radiation below the level necessary for fault-tolerant operation of a multiqubit array.