and challenges to the thermal management of low temperature devices. In this work, we investigate sub-1 K inter-chip thermal resistance of a flip-chip bonded assembly, where two silicon chips are interconnected by indium bumps by atmospheric thermocompression bonding. The temperature dependence of the inter-chip thermal resistance follows the power law of αT−3, with α=7.7−15.4 K4 μm2/nW and a thermal contact area of 0.306 mm2. The T−3 relation indicates phononic interfacial thermal resistance, which is supported by the vanishing electrical thermal conduction due to the superconducting interconnections. Such a thermal resistance value can introduce a thermalization bottleneck, which can be detrimental for some applications, but it can also be harnessed. We provide a study of the latter case by simulating the performance of solid-state junction microrefrigerator where we use the measured thermal resistance value.