two-level system (TLS) loss using internal quality factor measurements of superconducting transmission line resonators over a range of temperatures and readout powers. We applied this method to a series of α-Ta resonators that span a wide frequency range, thus providing a methodology for probing the loss mechanisms in the fabrication process of this emerging material for superconducting quantum circuits. We introduce an analytical model that captures the loss behavior without relying on numerical simulations, enabling straightforward interpretation and calibration. Additionally, our measurements reveal empirical frequency-dependent trends in key parameters of the model, suggesting contributions from mechanisms beyond the standard tunneling model of TLSs.