Sensing and metrology play an important role in fundamental science and applications, by fulfilling the ever-present need for more precise data sets, and by allowing to make more reliableconclusions on the validity of theoretical models. Sensors are ubiquitous, they are used in applications across a diverse range of fields including gravity imaging, geology, navigation, security, timekeeping, spectroscopy, chemistry, magnetometry, healthcare, and medicine. Current progress in quantum technologies inevitably triggers the exploration of quantum systems to be used as sensors with new and improved capabilities. This perspective initially provides a brief review of existing and tested quantum sensing systems, before discussing future possible directions of superconducting quantum circuits use for sensing and metrology: superconducting sensors including many entangled qubits and schemes employing Quantum Error Correction. The perspective also lists future research directions that could be of great value beyond quantum sensing, e.g. for applications in quantum computation and simulation.
The structural and nanochemical properties of thin AlOx layers are decisive for the performance of advanced electronic devices. For example, they are frequently used as tunnel barriersin Josephson junction-based superconducting devices. However, systematic studies of the influence of oxidation parameters on structural and nanochemical properties are rare up to now, as most studies focus on the electrical properties of AlOx layers. This study aims to close this gap by applying transmission electron microscopy in combination with electron energy loss spectroscopy to analyze the structural and nanochemical properties of differently fabricated AlOx layers and correlate them with fabrication parameters. With respect to the application of AlOx as tunnel barrier in superconducting Josephson junctions, Al/AlOx/Al-layer systems were deposited on Si substrates. We will show that the oxygen content and structure of amorphous AlOx layers is strongly dependent on the fabrication process and oxidation parameters. Dynamic and static oxidation of Al yields oxygen-deficient amorphous AlOx layers, where the oxygen content ranges from x = 0.5 to x = 1.3 depending on oxygen pressure and substrate temperature. Thicker layers of stoichiometric crystalline γ−Al2O3 layers were grown by electron-beam evaporation of Al2O3 and reactive sputter deposition.
This work is concerned with Al/Al-oxide(AlOx)/Al-layer systems which are important for Josephson-junction-based superconducting devices such as quantum bits. The device performanceis limited by noise, which has been to a large degree assigned to the presence and properties of two-level tunneling systems in the amorphous AlOx tunnel barrier. The study is focused on the correlation of the fabrication conditions, nanostructural and nanochemical properties and the occurrence of two-level tunneling systems with particular emphasis on the AlOx-layer. Electron-beam evaporation with two different processes and sputter deposition were used for structure fabrication, and the effect of illumination by ultraviolet light during Al-oxide formation is elucidated. Characterization was performed by analytical transmission electron microscopy and low-temperature dielectric measurements. We show that the fabrication conditions have a strong impact on the nanostructural and nanochemical properties of the layer systems and the properties of two-level tunneling systems. Based on the understanding of the observed structural characteristics, routes are derived towards the fabrication of Al/AlOx/Al-layers systems with improved properties.
Superconducting microwave resonators are reliable circuits widely used for detection and as test devices for material research. A reliable determination of their external and internalquality factors is crucial for many modern applications, which either require fast measurements or operate in the single photon regime with small signal to noise ratios. Here, we use the circle fit technique with diameter correction and provide a step by step guide for implementing an algorithm for robust fitting and calibration of complex resonator scattering data in the presence of noise. The speedup and robustness of the analysis are achieved by employing an algebraic rather than an iterative fit technique for the resonance circle.