Cryogenic single-port calibration for superconducting microwave resonator measurements

  1. Haozhi Wang,
  2. S. Singh,
  3. C.R.H. McRae,
  4. J.C. Bardin,
  5. S.-X. Lin,
  6. N. Messaoudi,
  7. A.R. Castelli,
  8. Y. J. Rosen,
  9. E. T. Holland,
  10. D. P. Pappas,
  11. and J. Y. Mutus
Superconducting circuit testing and materials loss characterization requires robust and reliable methods for the extraction of internal and coupling quality factors of microwave resonators. A common method, imposed by limitations on the device design or experimental configuration, is the single-port reflection geometry, i.e. reflection-mode. However, impedance mismatches in cryogenic systems must be accounted for through calibration of the measurement chain while it is at low temperatures. In this paper, we demonstrate a data-based, single-port calibration using commercial microwave standards and a vector network analyzer (VNA) with samples at millikelvin temperature in a dilution refrigerator, making this method useful for measurements of quantum phenomena. Finally, we cross reference our data-based, single-port calibration and reflection measurement with over-coupled 2D- and 3D-resonators against well established two-port techniques corroborating the validity of our method.
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