A Nonlinear Charge and Flux Tunable Cavity Derived from an Embedded Cooper Pair Transistor

  1. B. L. Brock,
  2. Juliang Li,
  3. S. Kanhirathingal,
  4. B. Thyagarajan,
  5. William F. Braasch Jr.,
  6. M. P. Blencowe,
  7. and A. J. Rimberg
We introduce the cavity-embedded Cooper pair transistor (cCPT), a device which behaves as a highly nonlinear microwave cavity whose resonant frequency can be tuned both by charging
a gate capacitor and by threading flux through a SQUID loop. We characterize this device and find excellent agreement between theory and experiment. A key difficulty in this characterization is the presence of frequency fluctuations comparable in scale to the cavity linewidth, which deform our measured resonance circles in accordance with recent theoretical predictions [B. L. Brock et al., Phys. Rev. Applied (to be published), arXiv:1906.11989]. By measuring the power spectral density of these frequency fluctuations at carefully chosen points in parameter space, we find that they are primarily a result of the 1/f charge and flux noise common in solid state devices. Notably, we also observe key signatures of frequency fluctuations induced by quantum fluctuations in the cavity field via the Kerr nonlinearity.

Frequency Fluctuations in Tunable Superconducting Microwave Cavities

  1. B. L. Brock,
  2. M. P. Blencowe,
  3. and A. J. Rimberg
We present a model for measurements of the scattering matrix elements of tunable microwave cavities in the presence of resonant frequency fluctuations induced by fluctuations in the
tuning parameter. We apply this model to the specific case of a two-sided cavity and find an analytic expression for the average scattering matrix elements. A key signature of this `fluctuating model‘ is a subtle deformation of the trajectories swept out by scattering matrix elements in the complex plane. We apply this model to experimental data and report a direct observation of this deformation in the data. Despite this signature, we show that the fluctuating and non-fluctuating models are qualitatively similar enough to be mistaken for one another, especially in the presence of measurement noise. However, if one applies the non-fluctuating model to data for which frequency fluctuations are significant then one will find damping rates that appear to depend on the tuning parameter, which is a common observation in tunable superconducting microwave cavities. We propose this model as both a potential explanation of and remedy to this apparent phenomenon.

Mechanically Generating Entangled Photons from the Vacuum: A Microwave Circuit-Acoustic Resonator Analogue of the Unruh Effect

  1. Hui Wang,
  2. M. P. Blencowe,
  3. C. M. Wilson,
  4. and A. J. Rimberg
We consider a model for an oscillatory, relativistic accelerating photodetector inside a cavity and show that the entangled photon pair production from the vacuum (Unruh effect) can
be accurately described in the steady state by a non-degenerate parametric amplifier (NDPA), with the detector’s accelerating center of mass serving as the parametric drive (pump). We propose an Unruh effect analogue NDPA microwave superconducting circuit scheme, where the breathing mode of the coupling capacitance between the cavity and detector provides the mechanical pump. For realizable circuit parameters, the resulting photon production from the vacuum should be detectable.

Quantum Dynamics of a Josephson Junction-Driven Cavity Mode System in the Presence of Voltage Bias Noise

  1. Hui Wang,
  2. M. P. Blencowe,
  3. A. D. Armour,
  4. and A. J. Rimberg
We give a semiclassical analysis of the average photon number as well as photon number variance (Fano factor F) for a Josephson-junction (JJ) embedded microwave cavity system, wherethe JJ is subject to a fluctuating (i.e. noisy) bias voltage with finite dc average. Through the ac Josephson effect, the dc voltage bias drives the effectively nonlinear microwave cavity mode into an amplitude squeezed state (F<1), as has been established previously [A. D. Armour, et al., Phys. Rev. Lett. 111, 247001 (2013)], but bias noise acts to degrade this squeezing. We find that the sensitivity of the Fano factor to bias voltage noise depends qualitatively on which stable fixed point regime the system is in for the corresponding classical nonlinear steady state dynamics. Furthermore, we show that the impact of voltage bias noise is most significant when the cavity is excited to states with large average photon number.[/expand]